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2010

title

tutorial / event

date

Simulation-aided Analysis (681 KB)

EMPA Dubendorf CH

11 June

Die LED - sie altert doch (1.2 MB) (German)

Forum "Optics meets Electronics" (SMT2010)

09 June

Selection of LED for lighting technology (1.8 MB) (German)

LED Workshop, Bavarian Laser Center

05 May

2009:

title

tutorial / event

date

Failure analysis of LEDs (1.3 MB) (German)

Workshop aging of laser diodes and LEDs

01 Dec

Access to Packaging (1.2 MB)

NMI Event, Cambridge University

22 April

Failure analysis of LEDs (702 KB) (German)

Forum Optics meets Electronics, SMT 09

05 May

Safe Product Launch  (682 KB)

NMI Quality & Reliability Network Event

05 Feb

2008:

title

tutorial / event

date

LED evaluation and test (1.4 MB)

shareholders` meeting

14 Oct

Analysis of BGA solder joints (627 KB) (German)

Herberg Re-Balling Forum

23 Sep

LEDs: Failure recognized - Failure eliminated (391 KB) (German)

Tutorial SMT 2008

03 June

Failure analysis on PCBs and solder process (482 KB) (German)

Tutorial SMT 2008

03 June

2007:

title

tutorial / event

date

Ensure long-term availability
of electronic devices (328 KB) (German)

15th FED Workshop

13-15 Sep

MSL-classification of RoHs-compliant devices/
Popcorn-effect (1.3 MB) (German)

15th FED Workshop

13-15 Sep

Qualification of optical and optoelectronic
modules with MEMS subcomponents (272 KB)

15th FED Workshop

13-15 Sep

Qualification of sensors (304 KB) (German)

ZVEI expert meeting,
Sensor+Test

24 May

Qualification, reliability and selection
of LEDs (1.5 MB)

SMT Tutorial Nuremberg

25 Apr

2006:

title

tutorial / event

date

Reliability test on integrated electrical
optical ciruit board (4.1 MB)

International symposium on
photonic packaging (electronica 06)

16 nov

Environmental tests mechanical/
Qualification solder profile (299 KB) (German)

internal presentation

15 Okt

Test, approval, analysis - economic test with
small quantities (457 KB) (German)

Silicon Saxony Symposium

13 Sep

Test of optoelectronic devices (621 KB) (German)

Silicon Saxony, AK ´Photonic´/
OptoNet, AK ´Optoelectronic´

28 April

2004

only available in German:

Titel

Tutorial/ Event

Datum

Qualification service (0.9 MB)

FED Workshop "progressive
test methods in electronics"

16 Sep

Failure analysis (560 KB)

FED Workshop "progressive
test methods in electronics"

16 Sep

Test of integrated devices (1.0 MB)

FED Workshop "progressive
test methods in electronics"

16 Sep

Robustness of PBAs and systems (217 KB)

FED Workshop "progressive
test methods in electronics"

16 Sep

component qualification (840 KB)

microtec Workshop
"from design to product"

05 Feb

Test programs (777 KB)

microtec Workshop
"from design to product"

05 Feb

Failure analysis (702 KB)

microtec Workshop
"from design to product"

05 Feb