- Press announcements.
- Publications.
- Picture Library.
Published articles with various topics
Press Contact: Reinhard Pusch, tel.: +49 711 867091-1, press relations
2010 (click for Details)
2009 (click for details)
2009 (click for details)
title | topic | published in |
|---|---|---|
RoodMicrotec offers fully automated Burn-In service | GSA back-end alley | GSA Forum 2009-Sep |
only available in German:
title | topic | published in |
|---|---|---|
to detect failure mechanisms in LEDs | LED failure mechanisms | E&E Kompendium 2009-10 |
RoodMicrotec labs DAR approved | ElektronikPraxis online 07-2009 | |
RoodMicrotec first European test lab with that service | all-electronics online 08-2009 |
2008 (click for details)
2008 (click for details)
title | topic | published in |
|---|---|---|
evaluating life time of components and modules | Laser+Photonics 2-2008 | |
Reliability tests on VCSELs (499 KB) | Life test on Vertical Cavity Surface Emitting Laser (VCSEL) | Laser+Photonics 1-2008 |
Low cost but challenging - LED selection and | Laser+Photonics 1-2008 |
only available in German:
title | topic | published in |
|---|---|---|
Automotive devices have to resist high solder temperature | E&E 6/2008 | |
Reliability vs. production costs (0.9 MB) | Failure rate of electronic devices to evaluate in advance (MTBF, FIT-rate, WEIBULL) | E & E Select Automotive S1/2008 |
Failure analysis and life test on LEDs | ElektronikPraxis online 14.04.2008 |
2007 (click for details)
2007 (click for details)
title | topic | published in |
|---|---|---|
Life time estimation, Weibull analysis, Reliability | EPP Europe, 9-10/2007 | |
LandisGyr-Newsletter (160 KB) | Component Management/ Qualification | LandisGyr-Newsletter, 7/2007 |
only available in German:
title | topic | published in |
|---|---|---|
microtec and Herberg Service Plus agree in cooperation | Test lab and EMV lab offer joint service | Elektronikpraxis, 21/2007 |
Why reliability tests on LEDs? (220 KB) -part 2- | Production and reliability tests on LEDs | productronic, 10/2007 |
25 years anniversary microtec (157 KB) | Reliability for more than 25 years - a company portrait | productronic special services, 8-9/2007 |
Classification of LEDs (121 KB) | Eye safety test not only for laser diodes but for LEDs | Elektronikpraxis, 15/2007 |
Why reliability tests on LEDs? (79 KB) -part 1- | LED life test and selection | 8-9/2007 |
Against aging (2.1 MB) | Case study aging & processability of automotive electronics | E&E, 9/2007 |
Tightened solder profile qualification for Automotive (289 KB) | Solder profile qualification lead free / for Automotive | PLUS, 8/2007 |
Qualification of LEDs | EPP, 7-8/2007 | |
Storage and solderability of stored products | PLUS, 6/2007 | |
The car standing still - what to do? (337 KB) | Failure analyses during development | E&E Sonderheft Automotive 4/2007 |
Destructive physical analysis (170 KB) | A method to define failure cause | Quality Engineering 4/2007 |
2006 (click for details)
2006 (click for details)
only available in German:
Titel | Thema | veröffentlicht in |
|---|---|---|
Method to evaluate long-time reliability | Elektronik special issue | |
Digital logic lerns to see (595 KB) | Test of CMOS and CCD image sensors | Laser&Photonik, 1/2006 |
2005 (click for details)
2005 (click for details)
published English articles:
title | topic | published in |
|---|---|---|
Telcordia qualification (70 KB) | profitable Telcordia qualification | Fibre Systems Europe, 7-8/2005 |
only available in German:
title | topic | published in |
|---|---|---|
Quality risiks on cable (562 KB) | Failure analysis localizes failures | PLUS 10/2005 |
long-term experience of employees valuated | Wirtschaftswoche 32/2005 | |
Interview of the week (155 KB) | Managing director Reinhard Pusch in discussion | Markt&Technik 23/2005 |
Testing prior to volume production (137 KB) | Quality assurance in automotive | Markt&Technik, 18/2005 |
Optical PCB (127 KB) | Exhibition SMT | SMT paper 05 |
New service optoelectronics (99 KB) | Exhibition SMT | productronic 4/2005 |
Mission reliability (326 KB) | company portrait | EPP 3-4/2005 |
2004 (click for details)
2004 (click for details)
only available in German:
title | topics | published in |
|---|---|---|
Popcorn effect (358 KB) | Long-term reliability of semiconductor packages | QZ 4/2004, |
Multiplexer for RF test (111 KB) | High-speed semiconductor test | QZ 1/2004, |