Failure analyses in order to clarify the failure cause soonest possible.
From single device to the whole system - and from highly complex IC up to printed circuit board (PCB), mounting & interconnection technology and printed board assembly (PBA).
- functional check on devices, printed board assemblies (PBAs), modules and systems
- verification of functionality
- circuit analysis
- failure simulation and reproduction
- optoelectronic and vehicle specific measurements
- Focused Ion Beam (FIB)
- X-ray and scanning acoustic microscopy
- light optical and scanning electron microscopy
- chemical and mechanical decapsulation
- failure localisation with emission microscopy and liquid cristall thermography
- reverse processing (wet and dry etching)
- metallographic cross-sectioning
- mounting- and material analysis
- solder joint assessment
- risk analysis and recommendation of corrective actions