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wafer probing, IC and ASIC test, programming

Semiconductor Test

tests regarding function, electrical and optoelectronical parameter

electrical test of wafer up to 8“ and packaged devices - selection and volume test

  • functional test in 3 temperature ranges with test systems of Advantest, Credence, Teradyne, Verigy
  • high flexibility for various package types
  • clean room conditions up to class 1000

Device Programming

  • for programmable logic, e.g. Flash, OTP´s, Eproms, µController with flash
  • for a variety of packages

Full automation programming facilitates laser marking and reeling in one work step.

End-of-Line Service

  • scanning and straightening of electronic devices
  • tape & reel, dry-pack (moisture barrier bag)
  • shipment to end customer worldwide