RoodMicrotec uses Jenoptik’s UFO Probe® Card technology for its PIC wafer level testing
Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established - for photonic integrated circuits (PICs), the test ecosystem is still under development. Jenoptik provides an essential component for novel PIC wafer level tests with the opto-electronic UFO Probe® Card. RoodMicrotec benefits from a fast and simple integration, high flexibility, and state-of-the-art test technology.