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Published articles with various topics

Press Contact: Reinhard Pusch, tel.: +49 711 867091-1, press relations

2017 (click for details)

2017 (click for details)

Titel 

Thema

veröffentlicht in

ASIC-Projekte für kleine und mittelständische Unternehmen (2.0 MB)

ASIC-Projekte entwickeln, testen und umsetzen (1.3 MB)

Ionische Verunreinigung von Baugruppen (1.4 MB)

Ionische Verunreinigungen - Auswirkungen (1.3 MB) 

Analyse mit Röntgen-Computertomografie (1.0 MB)

SCM

SCM

FA

FA

FA

Elektronik Journal 01/2017

productronic 03/2017

a.lot 04/2017

productronic 04/2017

productronic 05-06/2017

2016 (click for details)

2016 (click for details)

Title

Topic

published in

Erweiterung des Testparks um weitere High-End-Systeme (846 KB)

Der Kupfer-Ionen-Migration auf der Spur (1.1 MB)

Test

Fehleranalyse

http://www.all-electronics.de/

productronic 11/2016

2015 (click for details)

2014 (click for details)

2014 (click for details)

Title

Topic

published in

Qualität von A bis O (0.9 MB)

 

Partnersuche - Outsourcing von Schadteilanalysen und Belastungstest (1.2 MB)

Supply Chain Management

 Test

a:lot Sommer 2014

 

productronic 11/2014

Testdienstleister erfinden sich immer wieder neu (1.3 MB)

Test

http://www.all-electronics.de/

Wie ESD-gerecht sind ESD-Verpackungen (1.3 MB)

EMV/ESD Verpackungen

http://www.all-electronics.de/

2012 (click for details)

2012 (click for details)

Title

Topic

published in

Bis zu qualifizierten Serienbauteilen: Produktionsorientierte ASIC-Entwicklung

LED Test and Failure Analysis

Production-oriented ASIC Development

LED Test and Failure Analysis

elektronik industrie 11-2012, pages 16/17

http://www.all-electronics.de/

2011 (click for Details)

2011 (click for Details)

title

topic

published in

Vorbeugende Analysemethode  (541 KB)(German only)

Keramik-Kondensator-Feldausfälle

All Electronics 08/2011

2010 (click for Details)

2010 (click for Details)

title

topic

published in

ESD-Richtlinien unzureichend (German only) (150 KB)

ESDFOS (Electrostatic Discharge From Outside to Surface)

PLUS 5/2010

LED-Detektive auf Fehlersuche (German only) (203 KB)

LED-durability

Elektronik 12/2010

2009 (click for details)

2009 (click for details)

title

topic

published in

RoodMicrotec offers fully automated Burn-In service
 (229 KB)

GSA back-end alley

GSA Forum 2009-Sep

 only available in German: 

title

topic

published in

to detect failure mechanisms in LEDs

LED failure mechanisms

E&E Kompendium 2009-10

RoodMicrotec ISO/IEC 17025 accredited

RoodMicrotec labs DAR approved

ElektronikPraxis online 07-2009

Monitored Burn-In fully automated

RoodMicrotec first European test lab with that service

all-electronics online 08-2009

2008 (click for details)

2008 (click for details)

title

topic

published in

Being familiar with the life span can save costs (545 KB)

evaluating life time of components and modules

Laser+Photonics 2-2008

Reliability tests on VCSELs (499 KB)

Life test on Vertical Cavity Surface Emitting Laser (VCSEL)

Laser+Photonics 1-2008

Why reliability tests on light emitting diodes? (1.2 MB)

Low cost but challenging - LED selection and
reliability testing

Laser+Photonics 1-2008

only available in German:

title

topic

published in

So-called popcorn effect causes big bang (167 KB)

Automotive devices have to resist high solder temperature

E&E 6/2008

Reliability vs. production costs (0.9 MB)

Failure rate of electronic devices to evaluate in advance (MTBF, FIT-rate, WEIBULL)

E & E Select Automotive S1/2008

microtec expands test and analysis service for LEDs (88 KB)

Failure analysis and life test on LEDs

ElektronikPraxis online 14.04.2008

2007 (click for details)

2007 (click for details)

title

topic

published in

Reliability Engineering for electronic devices (211 KB)

Life time estimation, Weibull analysis, Reliability

EPP Europe, 9-10/2007

LandisGyr-Newsletter (160 KB)

Component Management/ Qualification

LandisGyr-Newsletter, 7/2007

only available in German:

title

topic

published in

microtec and Herberg Service Plus agree in cooperation
 (71 KB)

Test lab and EMV lab offer joint service

Elektronikpraxis, 21/2007

Why reliability tests on LEDs? (220 KB) -part 2-

Production and reliability tests on LEDs

productronic, 10/2007

25 years anniversary microtec (157 KB)

Reliability for more than 25 years - a company portrait

productronic special services, 8-9/2007

Classification of LEDs (121 KB)

Eye safety test not only for laser diodes but for LEDs

Elektronikpraxis, 15/2007

Why reliability tests on LEDs? (79 KB) -part 1-

LED life test and selection

8-9/2007

Against aging (2.1 MB)

Case study aging & processability of automotive electronics

E&E, 9/2007

Tightened solder profile qualification for Automotive (289 KB)

Solder profile qualification lead free / for Automotive

PLUS, 8/2007

When the light deteriorates

Qualification of LEDs

EPP, 7-8/2007

Aging mechanisms, optimal storage of spare parts
 (223 KB)

Storage and solderability of stored products

PLUS, 6/2007

The car standing still - what to do? (337 KB)

Failure analyses during  development

E&E Sonderheft Automotive 4/2007

Destructive physical analysis (170 KB)

A method to define failure cause

Quality Engineering 4/2007

2006 (click for details)

2006 (click for details)

only available in German:

Titel

Thema

veröffentlicht in

Destructive physical qualification
of devices
 (158 KB)

Method to evaluate long-time reliability

Elektronik special issue
Measuring+Test 5/2006

Digital logic lerns to see (595 KB)

Test of CMOS and CCD image sensors

Laser&Photonik, 1/2006

2005 (click for details)

2005 (click for details)

published English articles:

title

topic

published in

Telcordia qualification (70 KB)

profitable Telcordia qualification
- how it works

Fibre Systems Europe, 7-8/2005

only available in German:

title

topic

published in

Quality risiks on cable (562 KB)

Failure analysis localizes failures

PLUS 10/2005

Bright perspective - longer life worktime (180 KB)

long-term experience of employees valuated

Wirtschaftswoche 32/2005

Interview of the week (155 KB)

Managing director Reinhard Pusch in discussion

Markt&Technik 23/2005

Testing prior to volume production (137 KB)

Quality assurance in automotive

Markt&Technik, 18/2005

Optical PCB (127 KB)

Exhibition SMT

SMT paper 05

New service optoelectronics (99 KB)

Exhibition SMT

productronic 4/2005

Mission reliability (326 KB)

company portrait

EPP 3-4/2005

 

 

2004 (click for details)

2004 (click for details)

only available in German:

title

topics

published in

Popcorn effect (358 KB)

Long-term reliability of semiconductor packages

QZ 4/2004,
EPP 3/2004

Multiplexer for RF test (111 KB)

High-speed semiconductor test

QZ 1/2004,
EPP 1/2004